A beneficial application of backside SIMS for the depth profiling characterization of implanted siliconFUJIYAMA, N; HASEGAWA, T; SUDA, T et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 654-656, issn 0142-2421, 3 p.Conference Paper

A new time-of-flight SIMS instrument for 3D imaging and analysisHILL, Rowland; BLENKINSOPP, Paul; THOMPSON, Stephen et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 506-509, issn 0142-2421, 4 p.Conference Paper

Analysis of organic multilayered samples for optoelectronic devices by (low-energy) dynamic SIMSNGO, K. Q; PHILIPP, P; JIN, Y et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 194-197, issn 0142-2421, 4 p.Conference Paper

Depth Profiling of Anodic Tantalum Oxide Films with Gold Cluster IonsPOERSCHKE, David; WUCHER, Andreas.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 171-174, issn 0142-2421, 4 p.Conference Paper

Depth profiling by cluster projectiles as seen by computer simulationsPOSTAWA, Z; RZEZNIK, L; PARUCH, R et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 12-15, issn 0142-2421, 4 p.Conference Paper

Development of an energy-resolved method for SIMS in-depth analysis of metal-polymer interfacesTELLEZ, Helena; VADILLO, José M; LASERNA, J. Javier et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 632-634, issn 0142-2421, 3 p.Conference Paper

Evaluation of ionization yields under gallium bombardmentFRACHE, Gilles; EL ADIB, Brahim; AUDINOT, Jean-Nicolas et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 639-642, issn 0142-2421, 4 p.Conference Paper

Fundamental studies of molecular depth profiling using organic delta layers as model systemsLU, C; WUCHER, A; WINOGRAD, N et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 81-83, issn 0142-2421, 3 p.Conference Paper

Identification and Imaging of ¹⁵N labeled cells with ToF-SIMSTYLER, Bonnie J; TAKENO, Marc M; HAUCH, Kip D et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 336-339, issn 0142-2421, 4 p.Conference Paper

Interactive spatio-spectral analysis of three-dimensional mass-spectral (3DxMS) chemical imagesREICHENBACH, Stephen E; XUE TIAN; LINDQUIST, Robert et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 529-534, issn 0142-2421, 6 p.Conference Paper

Investigating the fundamentals of molecular depth profiling using strong-field photoionization of sputtered neutralsWILLINGHAM, D; BRENES, D. A; WINOGRAD, N et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 45-48, issn 0142-2421, 4 p.Conference Paper

Investigating the relation between the secondary yield enhancement and the structure of the metallic overlayer in metal-assisted SIMSNITTLER, L; DELCORTE, A; BERTRAND, P et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 103-106, issn 0142-2421, 4 p.Conference Paper

MCs⁺ depth profiling using cluster primary ionsNIEHUIS, E; GREHL, T; KOLLMER, F et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 204-206, issn 0142-2421, 3 p.Conference Paper

Molecular dynamics study of metal-organic samples bombarded by kiloelectronvolt projectilesRESTREPO, Oscar A; DELCORTE, Arnaud.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 70-73, issn 0142-2421, 4 p.Conference Paper

Numerical approach to resolve mass interference in depth profiling As in SiGeGUI, D; HUANG, Y. H; NISTALA, R. R et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 535-538, issn 0142-2421, 4 p.Conference Paper

Proposed ToF-SIMS/XPS standardization methods for bonding wires in electronic packaging applicationsSODHI, R; GALLAUGHER, M; WANG, Z et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 586-590, issn 0142-2421, 5 p.Conference Paper

RIMS analysis of Ca and Cr in Genesis solar wind collectorsVERYOVKIN, I. V; TRIPA, C. E; ZINOVEV, A. V et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 467-469, issn 0142-2421, 3 p.Conference Paper

Routine TOF-SIMS instrument control using polycarbonate materialFARTMANN, Michael; KERSTING, Reinhard; HAGENHOFF, Birgit et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 417-419, issn 0142-2421, 3 p.Conference Paper

Strategies for modeling diverse chemical reactions in molecular dynamics simulations of cluster bombardmentKENNEDY, Paul E; GARRISON, Barbara J; RUSSO, Michael F et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 126-128, issn 0142-2421, 3 p.Conference Paper

Surface analysis of polyvinyl chloride bombarded by Ar⁺ and charged water dropletsHIRAOKA, Kenzo; IIJIMA, Yoshitoki; SAKAI, Yuji et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 236-240, issn 0142-2421, 5 p.Conference Paper

Surface analysis of protein-resistant, plasma-polymerized ethylene glycol thin filmsCHOI, Changrok; JUNG, Donggeun; DAE WON MOON et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 331-335, issn 0142-2421, 5 p.Conference Paper

The effect of the H: C ratio on the sputtering of molecular solids by fullerenesWEBB, Roger P; GARRISON, Barbara J; VICKERMAN, John C et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 116-119, issn 0142-2421, 4 p.Conference Paper

Useful yields of organic molecules under dynamic SIMS cluster bombardmentGILLEN, Greg; SZAKAL, Christopher; BREWER, Tim M et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 376-379, issn 0142-2421, 4 p.Conference Paper

ZnO nanoparticles enhancing secondary ion signals of Escherichia coli analyzed by ToF-SIMSLEI, Shiou-Ling; YIN, Yu-Sheng; LEE, Pei-Ling et al.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 310-312, issn 0142-2421, 3 p.Conference Paper

Cluster primary ion sputtering: correlations in secondary ion intensities in TOF SIMSSEAH, M. P; GILMORE, I. S.Surface and interface analysis. 2011, Vol 43, Num 1-2, pp 228-235, issn 0142-2421, 8 p.Conference Paper